| This two day workshop is structured so that participants gain a solid understanding of the use of Statistical Process Control to drive process improvement. The class is taught through a balance lecture, class discussion, class exercises, and follow-on participant projects. Specific topics include both variables and attribute control charting. Specific variables control charting tools include X-BAR and R charts, as well as X and Moving R. Specific Attribute charting techniques are also presented including P, C, and U Charts. Also process capability indexes are presented and explained (i.e., Cp, Cpk, Pp, Ppk). Throughout the class a strong emphasis is placed on how to connect SPC with root causes oriented problem solving. Key concepts are reinforced through the use of catapults to simulate the real world linkage between SPC and process improvement. |
 Cost: $500
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| Who Should Attend: |
| Manufacturing Engineers, Quality Engineers, Managers, Supervisors, and other professionals. |
